TY  - BOOK
AU  - Breitenstein,O..
AU  - Langenkamp,M.
TI  - Lock-in thermography: basics and use for functional diagnostics of electronic components 
T2  - Springer series in advanced microelectronics
SN  - 3540434399
AV  - TK7870.25  .B73 2003
PY  - 2003///
CY  - New York
PB  - Springer
KW  - Electronic apparatus and appliances
KW  - Thermal properties
KW  - Testing
KW  - Semiconductors
KW  - Thermography
ER  -