TY  - BOOK
AU  - Schroder,Dieter K.
TI  - Semiconductor material and device characterization
SN  - 0471739065
AV  - QC611  .S33 2006
PY  - 2006///
CY  - Hoboken, NJ
PB  - John Wiley
KW  - Semiconductors
KW  - Testing
ER  -