Oxide reliability :  a summary of silicon oxide wearout, breakdown and reliability / 
editor, D. J. Dumin. 
 - ix, 270 pages :  illustrations ;  26 cm. 
 - Selected topics in electronics and systems ;  v. 23 .
<br/><br/><label>ISBN: </label>9810248423 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors --Reliability.<br/>Silicon oxide --Deterioration.
<br/><br/><label>LC Class. No.: </label>TK7871.99.M44   / .O94 2002