TY  - BOOK
AU  - Dumin,D.J.
TI  - Oxide reliability: a summary of silicon oxide wearout, breakdown and reliability 
T2  - Selected topics in electronics and systems
SN  - 9810248423
AV  - TK7871.99.M44  .O94 2002
PY  - 2002///
CY  - River Edge, NJ
PB  - World Scientific
KW  - Metal oxide semiconductors
KW  - Reliability
KW  - Silicon oxide
KW  - Deterioration
ER  -