Image pattern recognition :  synthesis and analysis in biometrics / 
editors, Svetlana N. Yanushkevich ... [and others] ; consulting editor, Mark S. Nixon. 
 - Series in machine perception and artificial intelligence ;  v. 67 .
<br/><br/> Some of the new ideas were first presented at the international workshop on Biometric Technologies: Modeling and Simulation held in June 2004 in Calgary, Canada 
<br/><br/><label>ISBN: </label>9789812569080 9812569081 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Pattern recognition systems --Congresses.<br/>Pattern recognition systems --Mathematical models --Congresses.<br/>Biometric identification --Congresses.<br/>Identification --Automation --Congresses.
<br/><br/><label>LC Class. No.: </label>TK7882.P3   / .I42 2007