Defect-oriented testing for nano-metric CMOS VLSI circuits / 
edited by Manoj Sachdev, Jose Pineda de Gyvez. 
 - 2nd ed. 
 - Frontiers in electronic testing ;  34 .
<br/><br/> New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998. 
<br/><br/><label>ISBN: </label>9780387465463 0387465464 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors, Complementary --Testing.<br/>Metal oxide semiconductors, Complementary --Defects.<br/>Integrated circuits --Very large scale integration --Testing.<br/>Integrated circuits --Very large scale integration --Defects.
<br/><br/><label>LC Class. No.: </label>TK7871.99.M44   / .D43 2007