Gettering and defect engineering in semiconductor technology XII :  GADEST 2007 : Proceedings of the 12th International Autumn Meeting EMFCSC, Erice, Italy : October 14-19, 2007 / 
edited by, A. Cavallini ... [and others]. 
 - xv, 642 pages :  illustrations ;  25 cm. 
<br/><br/><label>ISBN: </label>9783908451433 3908451434 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors --Congresses.<br/>Getters --Congresses.<br/>Silicon crystals --Defects --Congresses.<br/>Electrical engineering --Materials --Congresses.
<br/><br/><label>LC Class. No.: </label>TK7871.85   / .G47 2008