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Defects in microelectronic materials and devices / edited by, Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf.

Contributor(s):

Material type: Text

Text

TextPublisher: Boca Raton, FL : CRC, 2009Description: xvi, 753 pages : illustrations ; 26 cmContent type:

text

Media type:

unmediated

Carrier type:

volume

ISBN:

9781420043761
1420043765

Subject(s):

LOC classification:

TK7871 .D43 2009

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