Risk methodologies for technological legacies / edited by Dennis C. Bley, James G. Droppo and Vitaly A. Eremenko.

Contributor(s):

Material type: Text

TextSeries: Publisher: Dordrecht : Kluwer Academic Publishers, 2003Description: xxvii, 366 pages : illustrations, maps ; 25 cmContent type:

Media type:

Carrier type:

ISBN:

Subject(s):

LOC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TD898.14 .R57 2003 (Browse shelf(Opens below))	Available		1000111438

1 3

There are no comments on this title.

to post a comment.