In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II / Gudrun Kissinger and Larg H. Weiland,chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineeri.

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TextSeries: Publisher: Bellingham, WA : SPIE, 2001Description: ix, 242 pages : illustrations ; 28 cmContent type:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK7874.75 .I6 2001 (Browse shelf(Opens below))	Available		1000094086
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK7874.75 .I6 2001 (Browse shelf(Opens below))	Available		1000094094

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