Infrared characterization for microelectronics / W. S. Lau.

By:

Material type: Text

TextPublisher: Hoboken, NJ : World Scientific, 1999Description: x, 160 pages : illustrations ; 23 cmContent type:

Media type:

Carrier type:

ISBN:

Subject(s):

LOC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK7871 .L38 1999 (Browse shelf(Opens below))	Available		1000242374

1 3

There are no comments on this title.

to post a comment.