Electromigration in thin films and electronic devices : materials and reliability / edited by Choong-Un Kim.

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TextSeries: Publisher: Oxford : Woodhead Publishing, 2011Description: xiii, 340 pages : illustrations ; 25 cmContent type:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK7874 .E53 2011 (Browse shelf(Opens below))	Available		1000288321

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