Power-aware testing and test strategies for low power devices / editors, Patrick Girard, Nicola Nicolici, Xiaoqing Wen

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Material type: Text

TextPublication details: New York : Springer, 2010Description: xxi, 363 p. : ill. ; 24 cmISBN:

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Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK7874 .P68 2010 (Browse shelf(Opens below))	Available		1000248212

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