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Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland

By:

Goodhew, Peter J

Contributor(s):

Material type: Text

Text

TextPublication details: New York : Taylor & Francis, 2001Edition: 3rd edDescription: x, 251 p. : ill. ; 23 cmISBN:

9780748409686 (pbk.)
0748409688 (pbk.)

Subject(s):

Electron microscopy

LOC classification:

QH212.E4 .G66 2001

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	QH212.E4 .G66 2001 (Browse shelf(Opens below))	Available		1000263351

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