Protocol test systems : proceedings of the IFIP TC6 Second International Workshop on Protocol Test Systems, organized by GMD-Fokus and IBM-ENC, Berlin, F.R.G., 3-6 October 1989 / edited by Jan De Neer, Lothar Mackert, Wolfgang Effelsberg

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Material type: Text

TextPublication details: Amsterdam : North-Holland, 1990Description: 371 pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK5105.5 I23P 1989 (Browse shelf(Opens below))	Available		SF0000912

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