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	1.	Power-aware testing and test strategies for low power devices / editors, Patrick Girard, Nicola Nicolici, Xiaoqing Wen by Girard, Patrick Nicolici, Nicola Wen, Xiaoqing Material type: Text; Format: print Publication details: New York : Springer, 2010 Availability: Items available for loan: PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH (1)Call number: TK7874 .P68 2010. Place hold Place recall Add to cart (remove)
	2.	VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. by Wang, Laung-Terng Wu, Cheng-Wen Wen, Xiaoqing Series: Material type: Text; Format: print Publisher: Boston : Elsevier, 2006 Availability: Items available for loan: PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH (1)Call number: TK7874.75 .V58 2006. Place hold Place recall Add to cart (remove)

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