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VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. by Series:
Material type: Text Text; Format: print
Publisher: Boston : Elsevier, 2006
Availability: Items available for loan: PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH (1)Call number: TK7874.75 .V58 2006.

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