| 000 | 00873cam a2200241 4500 | ||
|---|---|---|---|
| 001 | u103402 | ||
| 003 | SIRSI | ||
| 008 | 110131 eng | ||
| 020 | _a1441909273 | ||
| 020 | _a9781441909275 | ||
| 050 |
_aTK7874 _b.P68 2010 |
||
| 245 | 0 | 0 |
_aPower-aware testing and test strategies for low power devices / _ceditors, Patrick Girard, Nicola Nicolici, Xiaoqing Wen |
| 260 |
_aNew York : _bSpringer, _c2010 |
||
| 300 |
_axxi, 363 p. : _bill. ; _c24 cm. |
||
| 650 | 0 |
_aLow voltage integrated circuits _xPower supply |
|
| 650 | 0 |
_aLow voltage integrated circuits _xTesting |
|
| 700 | 1 | _aGirard, Patrick | |
| 700 | 1 | _aNicolici, Nicola | |
| 700 | 1 | _aWen, Xiaoqing | |
| 907 |
_a.b10207867 _b29-08-23 _c05-09-18 |
||
| 998 |
_am _b29-08-23 _cm _da _e- _feng _g _h0 |
||
| 999 |
_c12168 _d12168 |
||