| 000 | 01045cam a2200277 4500 | ||
|---|---|---|---|
| 001 | u108175 | ||
| 003 | SIRSI | ||
| 008 | 110131 eng | ||
| 020 | _a1606500449 | ||
| 020 | _a9781606500446 | ||
| 050 |
_aQC176.9.O73 _b.C42 2010 |
||
| 245 | 0 | 0 |
_aCharacterization of organic thin films / _cAbraham Ulman, editors Yale Strausser and Gary E.Mcguire ; series editors, C.Richard Brundle and Charles A.Evans |
| 260 |
_aNew York : _bMomentum, _c2010 |
||
| 300 |
_axvii, 276 p. : _bill. ; _c23 cm. |
||
| 490 | 1 | _aMaterials characterization series | |
| 650 | 0 | _aOrganic thin films | |
| 700 | 1 | _aUlman, Abraham | |
| 700 | 1 | _aStrausser, Yale | |
| 700 | 1 | _aMcGuire, Gary E. | |
| 700 | 1 | _aBrundle, C. Richard | |
| 700 | 1 | _aEvans, Charles A. | |
| 907 |
_a.b10213338 _b29-08-23 _c05-09-18 |
||
| 998 |
_am _b29-08-23 _cm _da _e- _feng _g _h0 |
||
| 999 |
_c12714 _d12714 |
||