| 000 | 01154cam a2200313 i 4500 | ||
|---|---|---|---|
| 001 | u15919 | ||
| 003 | SIRSI | ||
| 005 | 20240619145459.0 | ||
| 008 | 110131 eng | ||
| 020 | _a0070576971 | ||
| 050 |
_aQC611.24 _b.R86 1998 |
||
| 100 | 1 |
_aRunyan, W. R.. , _eauthor _988058 |
|
| 245 | 1 | 0 |
_aSemiconductor measurements and instrumentation / _cW. R. Runyan, T. J. Shaffner. |
| 250 | _a2nd ed. | ||
| 264 | 1 |
_aNew York : _bMcGraw-Hill, _c1998. |
|
| 300 |
_ax, 453 pages : _billustrations ; _c24 cm. |
||
| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_aunmediated _bn _2rdamedia |
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| 338 |
_avolume _bnc _2rdacarrier |
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| 596 | _a3 | ||
| 650 | 0 |
_aSemiconductors. _93882 |
|
| 650 | 0 |
_aPhysical measurements. _917064 |
|
| 700 | 1 |
_aShaffner, T. J. _988059 |
|
| 907 |
_a.b10269125 _b07-11-22 _c12-09-18 |
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| 998 |
_am _b06-11-22 _cm _da _e- _feng _g _h0 |
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| 999 |
_c18289 _d18289 |
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