| 000 | 00948cam a2200277 i 4500 | ||
|---|---|---|---|
| 001 | u28767 | ||
| 003 | SIRSI | ||
| 005 | 20240619145551.0 | ||
| 008 | 110131 eng | ||
| 020 | _a0471241415 | ||
| 050 |
_aQC176.83 _b.I57 2001 |
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| 245 | 0 | 0 |
_aIn situ real-time characterization of thin films / _cedited by Orlando Auciello, Alan R. Krauss. |
| 264 | 1 |
_aNew York : _bJohn Wiley, _c2001. |
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| 300 |
_axi, 263 pages : _billustrations ; _c24 cm. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_aunmediated _bn _2rdamedia |
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| 338 |
_avolume _bnc _2rdacarrier |
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| 500 | _aA Wiley-Interscience Publication | ||
| 596 | _a3 | ||
| 650 | 0 |
_aThin films. _97928 |
|
| 700 | 1 |
_aAuciello, Orlando. _9126309 |
|
| 700 | 1 |
_aKrauss, Alan R. _9126310 |
|
| 907 |
_a.b10292470 _b07-11-22 _c12-09-18 |
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| 998 |
_am _b06-11-22 _cm _da _e- _feng _g _h0 |
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| 999 |
_c20618 _d20618 |
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