| 000 | 00655cam a2200205 4500 | ||
|---|---|---|---|
| 001 | u39186 | ||
| 003 | SIRSI | ||
| 008 | 110131 eng | ||
| 020 | _a0470847123 | ||
| 050 |
_aTP156.S95 _b.W37 2003 |
||
| 100 | 1 | _aWatts, John F. | |
| 245 | 1 | 3 |
_aAn introduction to surface analysis by XPS and AES / _cJohn F. Watts, John Wolstenholme |
| 260 |
_aChichester : _bJohn Wiley, _c2003 |
||
| 300 |
_ax, 212 p. : _bill. ; _c23 cm. |
||
| 650 | 0 |
_aSurfaces (Technology) _xAnalysis |
|
| 650 | 0 | _aElectron spectroscopy | |
| 700 | 1 | _aWolstenholme, John | |
| 907 |
_a.b10306870 _b12-09-18 _c12-09-18 |
||
| 998 |
_am _b12-09-18 _cm _da _e- _feng _g _h3 |
||
| 999 |
_c22057 _d22057 |
||