| 000 | 01202cam a2200313 i 4500 | ||
|---|---|---|---|
| 001 | u63841 | ||
| 003 | SIRSI | ||
| 005 | 20240619145752.0 | ||
| 008 | 110131 eng | ||
| 020 | _a352740502X | ||
| 020 | _a9783527405022 | ||
| 050 |
_aQC176.8.N35 _b.N35 2005 |
||
| 245 | 0 | 0 |
_aNanoscale calibration standards and methods : _bdimensional and related measurements in the micro- and nanometer range / _cedited by Gunter Wilkening, Ludger Koenders. |
| 264 | 1 |
_aNew York : _bJohn Wiley, _c2005. |
|
| 300 |
_axxii, 519 pages : _billustrations ; _c25 cm. |
||
| 336 |
_atext _btxt _2rdacontent |
||
| 337 |
_aunmediated _bn _2rdamedia |
||
| 338 |
_avolume _bnc _2rdacarrier |
||
| 596 | _a1 3 | ||
| 650 | 0 |
_aNanostructured materials _xMeasurement. _9171226 |
|
| 650 | 0 |
_aMicrostructure _xMeasurement. _98252 |
|
| 650 | 0 |
_aScientific apparatus and instruments _xCalibration. _9171227 |
|
| 650 | 0 |
_aStereology. _9171228 |
|
| 700 | 1 |
_aWilkening, Gunter. _9171229 |
|
| 700 | 1 |
_aKoenders, Ludger. _9171230 |
|
| 907 |
_a.b10346806 _b07-11-22 _c12-09-18 |
||
| 998 |
_am _b06-11-22 _cm _da _e- _feng _g _h0 |
||
| 999 |
_c26050 _d26050 |
||