000 01135cam a2200313 i 4500
001 u73875
003 SIRSI
005 20240619145832.0
008 110131 eng
020 _a9780831132033
020 _a0831132035
050 _aHD47.3
_b.S27 2005
100 1 _aSato, Yoshihiko. ,
_eauthor
_9183258
245 1 0 _aValue analysis tear-down :
_ba new process for product development and innovation /
_cYoshihiko Sato and J. Jerry Kaufman.
264 1 _aNew York :
_bSociety of Manufacturing Engineers,
_c2005.
300 _ax, 206 pages :
_billustrations ;
_c24 cm.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
596 _a1 3
650 0 _aValue analysis (Cost control).
_96441
650 0 _aIndustrial productivity.
_910763
650 0 _aNew products.
_94834
650 0 _aEngineering economy.
_913589
700 1 _aKaufman, J. Jerry.
_9152983
907 _a.b10365254
_b07-11-22
_c12-09-18
998 _am
_b06-11-22
_cm
_da
_e-
_feng
_g
_h0
999 _c27894
_d27894