000 01008cam a2200289 i 4500
001 u76822
003 SIRSI
005 20240619145845.0
008 110131 eng
020 _a0387333258
020 _a9780387333250
050 _aQH212.S3
_b.S32 2007
245 0 0 _aScanning microscopy for nanotechnology :
_btechniques and applications /
_cedited by Weilie Zhou and Zhong Lin Wang.
264 1 _aNew York :
_bSpringer,
_c2007.
300 _axiv, 522 pages :
_billustrations color ;
_c24 cm.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
596 _a1 3
650 0 _aScanning electron microscopy.
_9128016
650 0 _aNanotechnology.
_9503
700 1 _aWang, Zhong Lin.
_9171241
700 1 _aZhou, Weilie.
_9186805
907 _a.b10371230
_b07-11-22
_c12-09-18
998 _am
_b06-11-22
_cm
_da
_e-
_feng
_g
_h0
999 _c28492
_d28492