| 000 | 00956cam a2200277 i 4500 | ||
|---|---|---|---|
| 001 | u99069 | ||
| 003 | SIRSI | ||
| 005 | 20240619145931.0 | ||
| 008 | 110131 eng | ||
| 020 | _a9780521831994 | ||
| 020 | _a0521831997 | ||
| 050 |
_aQC702.7.B65 _b.F62 2007 |
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| 245 | 0 | 0 |
_aFocused Ion Beam Systems: Basics and Applications / _cedited by Yao Nan. |
| 264 | 1 |
_aCambridge : _bCambridge University Press, _c2007. |
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| 300 |
_axi, 395 pages : _billustrations ; _c26 cm. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_aunmediated _bn _2rdamedia |
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| 338 |
_avolume _bnc _2rdacarrier |
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| 596 | _a1 3 | ||
| 650 | 0 |
_aFocused ion beams. _9213880 |
|
| 650 | 0 |
_aFocused ion beams _xIndustrial applications. _9213881 |
|
| 700 | 1 |
_aNan, Yao. _9213882 |
|
| 907 |
_a.b1039235x _b07-11-22 _c15-11-18 |
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| 998 |
_am _b06-11-22 _cm _da _e- _feng _g _h0 |
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| 999 |
_c30597 _d30597 |
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