000 01063cam a2200277 i 4500
001 u9468
003 SIRSI
005 20240619150124.0
008 990721 00 eng
020 _a0471143286
050 _aTS173
_b.M33 1998
100 1 _aMeeker, William Q. ,
_eauthor
_9208452
245 1 0 _aStatistical methds for reliability data /
_cWilliam Q. Meeker, Luis A. Escobar.
264 1 _aNew York :
_bJohn Wiley,
_c1998.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
596 _a1 3
650 0 _aReliability (Engineering)
_xStatistical methods.
_91484
700 0 _aEscobar, Luis A.
_9208453
907 _a.b10444609
_b07-11-22
_c28-11-18
998 _am
_b06-11-22
_cm
_da
_e-
_feng
_g
_h0
999 _c35820
_d35820