| 000 | 01125cam a2200313 i 4500 | ||
|---|---|---|---|
| 001 | u132983 | ||
| 003 | SIRSI | ||
| 005 | 20240619150233.0 | ||
| 008 | 120413n 000 0 eng u | ||
| 020 | _a9780470978696 | ||
| 020 | _a0470978694 | ||
| 050 | 1 | 4 |
_aTK7875 _b.D53 2011 |
| 245 | 0 | 0 |
_aDigital holography for MEMS and microsystem metrology / _cedited by Anand Asundi. |
| 264 | 1 |
_aHoboken : _bJohn Wiley, _c2011. |
|
| 300 |
_axxii, 205 pages : _billustrations ; _c24 cm. |
||
| 336 |
_atext _btxt _2rdacontent |
||
| 337 |
_aunmediated _bn _2rdamedia |
||
| 338 |
_avolume _bnc _2rdacarrier |
||
| 490 | 1 | _aWiley microsystem and nanotechnology series | |
| 596 | _a1 3 | ||
| 650 | 0 |
_aMicroelectromechanical systems _xMeasurement. _93145 |
|
| 650 | 0 |
_aMicroelectronics _xMeasurement. _923274 |
|
| 650 | 0 |
_aHolographic testing. _952843 |
|
| 650 | 0 |
_aImage processing _xDigital techniques. _9376 |
|
| 700 | 1 |
_aAsundi, Anand. _952844 |
|
| 907 |
_a.b1047562x _b07-11-22 _c27-12-18 |
||
| 998 |
_am _b06-11-22 _cm _da _e- _feng _g _h0 |
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| 999 |
_c38920 _d38920 |
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