000 00797cam a2200217 4500
001 u103400
003 SIRSI
008 110131 eng
020 _a9781441909305
020 _a1441909303
050 _aTK7874.75
_b.G37 2010
100 1 _aGarg, Rajesh
245 1 0 _aAnalysis and design of resilient VLSI circuits :
_bmitigating soft errors and process variations /
_cRajesh Garg, Sunil P. Khatri
260 _aNew York :
_bSpringer,
_c2010
300 _axxiii, 212 p. :
_bill. ;
_c25 cm.
650 0 _aIntegrated circuits
_xVery large scale integration
700 1 _aKhatri, Sunil P.
907 _a.b10067425
_b29-08-23
_c15-03-18
998 _am
_b29-08-23
_cm
_da
_e-
_feng
_g
_h0
999 _c4184
_d4184