000			02301cam a2200385 i 4500
001			u526682
003			IIUM
005			20240619150614.0
008			160121t1998 nyua g b 001 0 eng c
010			_a97039270
020			_a0471143286 (hardback)
020			_a9780471143284 (hardback)
040			_aUIAM _beng _erda
050	0	0	_aTS173 M494S 1998
100	1		_aMeeker, William Q
245	1	0	_aStatistical methods for reliability data / _cWilliam Q. Meeker, Luis A. Escobar
264		1	_aNew York : _bWiley, _c1998
264		4	_c1998
300			_axxii, 680 pages : _billlustrations ; _c25 cm.
336			_atext _2rdacontent
337			_aunmediated _2rdamedia
338			_avolume _2rdacarrier
490	1		_aWiley series in probability and statistics. Applied probability and statistics section
500			_a"A Wiley-Interscience publication."
504			_aIncludes bibliographical references (p. 645-663) and indexes.
505	0		_aReliability Concepts and Reliability Data -- Models, Censoring, and Likelihood for Failure-Time Data -- Nonparametric Estimation -- Location-Scale-Based Parametric Distributions -- Other Parametric Distributions -- Probability Plotting -- Parametric Likelihood Fitting Concepts: Exponential Distribution -- Maximum Likelihood for Log-Location-Scale Distributions -- Bootstrap Confidence Intervals -- Planning Life Tests -- Parametric Maximum Likelihood: Other Models -- Prediction of Future Random Quantities -- Degradation Data, Models, and Data Analysis -- Introduction to the Use of Bayesian Methods for Reliability Data -- System Reliability Concepts and Methods -- Analysis of Repairable System and Other Recurrence Data -- Failure-Time Regression Analysis -- Accelerated Test Models -- Accelerated Life Tests -- Planning Accelerated Life Tests -- Accelerated Degradation Tests -- Case Studies and Further Applications
650		0	_aReliability (Engineering) _xStatistical methods
700	1		_aEscobar, Luis A
830		0	_aWiley series in probability and statistics. _pApplied probability and statistics
907			_a.b10573197 _b05-05-21 _c23-02-21
998			_am _b23-02-21 _cm _da _e- _feng _gnyu _h0
999			_c48649 _d48649