000 01240cam a22003734i 4500
001 u137221
003 SIRSI
005 20240619150652.0
008 210914t2013 flua b 001 0 engd
020 _a9781439854150
_q(hardback)
040 _beng
_erda
_dSFAPGOH
050 0 0 _aTA418.9.N35
_b.M93 2013
100 1 _aMyhra, Sverre. ,
_eauthor
_920520
245 1 0 _aCharacterization of nanostructures /
_cSverre Myhra and John C. Riviere.
264 _aBoca Raton :
_bTaylor and Francis,
_c2013.
264 _c©2013
300 _a1 volume :
_billustrations ;
_c24 cm.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
504 _aInclude bibliographical references and index
596 _a1 4
650 0 _aNanostructured materials.
_97519
650 0 _aNanostructures
_xOptical properties.
_929939
650 0 _aNanotechnology.
_9503
650 0 _aImaging systems.
_99399
700 1 _aRiviere, John C.
_920519
907 _a.b1059128x
_b14-09-21
_c06-04-21
998 _am
_b14-09-21
_cm
_da
_e-
_feng
_gflu
_h0
999 _c50456
_d50456