| 000 | 01160cam a22003258i 4500 | ||
|---|---|---|---|
| 001 | u151985 | ||
| 003 | UTHM | ||
| 005 | 20240619150659.0 | ||
| 008 | 130513s2013 nju b 001 0 eng | ||
| 020 | _a9781118288238 | ||
| 020 | _a1118288238 | ||
| 040 |
_aeng _brda _dSFPAGOH |
||
| 050 |
_aTA417.23 _b.S324 2013 |
||
| 245 | 0 | 0 |
_aScanning probe microscopy for industrial applications : _bnanomechanical characterization / _cedited by Dalia G. Yablon. |
| 264 | 1 |
_aHoboken : _bWileys, _c2013. |
|
| 300 |
_axix, 347 pages : _billustrations (some color) ; _c24 cm. |
||
| 336 |
_atext _btxt _2rdacontent |
||
| 337 |
_aunmediated _bn _2rdamedia |
||
| 338 |
_avolume _bnc _2rdacarrier |
||
| 596 | _a1 4 | ||
| 650 | 0 |
_aMaterials _xMicroscopy. _937742 |
|
| 650 | 0 |
_aScanning probe microscopy _xIndustrial applications. _930923 |
|
| 650 | 0 |
_aTechnology & Engineering _xNanotechnology & Mems. _957888 |
|
| 700 | 1 |
_aYablon, Dalia G. _978365 |
|
| 907 |
_a.b10594206 _b29-09-21 _c06-04-21 |
||
| 998 |
_am _b06-04-21 _cm _da _e- _feng _gnju _h0 |
||
| 999 |
_c50748 _d50748 |
||