| 000 | 00875cam a2200265 i 4500 | ||
|---|---|---|---|
| 001 | u39186 | ||
| 003 | SIRSI | ||
| 005 | 20240619150816.0 | ||
| 008 | 110131 eng | ||
| 020 | _a0470847123 | ||
| 050 |
_aTP156.S95 _b.W37 2003 |
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| 100 | 1 |
_aWatts, John F. , _eauthor _9140337 |
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| 245 | 1 | 3 |
_aAn introduction to surface analysis by XPS and AES / _cJohn F. Watts, John Wolstenholme. |
| 264 | 1 |
_aChichester : _bJohn Wiley, _c2003. |
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| 300 |
_ax, 212 pages : _billustrations ; _c23 cm. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_aunmediated _bn _2rdamedia |
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| 338 |
_avolume _bnc _2rdacarrier |
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| 596 | _a3 | ||
| 650 | 0 |
_aSurfaces (Technology) _xAnalysis. _91572 |
|
| 650 | 0 |
_aElectron spectroscopy. _920329 |
|
| 700 | 1 |
_aWolstenholme, John. _9140338 |
|
| 907 |
_a.b10629956 _b07-11-22 _c07-11-22 |
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| 998 |
_am _b06-11-22 _cm _da _e- _feng _g _h3 |
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| 999 |
_c54304 _d54304 |
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