| 000 | 01022cam a2200289 i 4500 | ||
|---|---|---|---|
| 001 | u42174 | ||
| 003 | SIRSI | ||
| 005 | 20240619145059.0 | ||
| 008 | 110131 eng | ||
| 020 | _a047149240X | ||
| 050 |
_aTK7871.852 _b.W34 2000 |
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| 100 | 1 |
_aWai, Kin Chim. , _eauthor _9144271 |
|
| 245 | 1 | 0 |
_aSemiconductor device and failure analysis : _busing photon emission microscopy / _cWai Kin Chim. |
| 264 | 1 |
_aChichester : _bJohn Wiley, _c2000. |
|
| 300 |
_axv, 269 pages : _billustrations ; _c24 cm. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_aunmediated _bn _2rdamedia |
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| 338 |
_avolume _bnc _2rdacarrier |
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| 596 | _a1 3 | ||
| 650 | 0 |
_aSemiconductors _xFailures. _93882 |
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| 650 | 0 |
_aSemiconductors _xTesting. _93882 |
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| 650 | 0 |
_aSemiconductors _xMicroscopy. _93882 |
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| 650 | 0 |
_aPhoton emission. _939741 |
|
| 907 |
_a.b10122795 _b07-11-22 _c15-03-18 |
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| 998 |
_am _b06-11-22 _cm _da _e- _feng _g _h0 |
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| 999 |
_c7219 _d7219 |
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