| 000 | 01223cam a2200313 i 4500 | ||
|---|---|---|---|
| 001 | u48194 | ||
| 003 | SIRSI | ||
| 005 | 20240619145104.0 | ||
| 008 | 110131 eng | ||
| 020 | _a3540434399 | ||
| 050 |
_aTK7870.25 _b.B73 2003 |
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| 100 | 1 |
_aBreitenstein, O.. , _eauthor _9152402 |
|
| 245 | 1 | 0 |
_aLock-in thermography : _bbasics and use for functional diagnostics of electronic components / _cO. Breitenstein, M. Langenkamp. |
| 264 | 1 |
_aNew York : _bSpringer, _c2003. |
|
| 300 |
_aviii, 193 pages : _billustrations (some color) ; _c24 cm. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_aunmediated _bn _2rdamedia |
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| 338 |
_avolume _bnc _2rdacarrier |
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| 490 | 1 | _aSpringer series in advanced microelectronics | |
| 596 | _a3 | ||
| 650 | 0 |
_aElectronic apparatus and appliances _xThermal properties. _926575 |
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| 650 | 0 |
_aElectronic apparatus and appliances _xTesting. _953673 |
|
| 650 | 0 |
_aSemiconductors _xThermal properties. _93882 |
|
| 650 | 0 |
_aThermography. _922241 |
|
| 700 | 1 |
_aLangenkamp, M. _9152403 |
|
| 907 |
_a.b10126697 _b07-11-22 _c15-03-18 |
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| 998 |
_am _b06-11-22 _cm _da _e- _feng _g _h0 |
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| 999 |
_c7444 _d7444 |
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