| 000 | 01048cam a2200301 i 4500 | ||
|---|---|---|---|
| 001 | u64468 | ||
| 003 | SIRSI | ||
| 005 | 20240619145124.0 | ||
| 008 | 110131 eng | ||
| 020 | _a0471739065 | ||
| 020 | _a9780471739067 | ||
| 050 |
_aQC611 _b.S33 2006 |
||
| 100 | 1 |
_aSchroder, Dieter K. , _eauthor _9110645 |
|
| 245 | 1 | 0 |
_aSemiconductor material and device characterization / _cDieter K. Schroder. |
| 250 | _a3rd ed. | ||
| 264 | 1 |
_aHoboken, NJ : _bJohn Wiley, _c2006. |
|
| 300 |
_axv, 779 pages : _billustrations ; _c25 cm. |
||
| 336 |
_atext _btxt _2rdacontent |
||
| 337 |
_aunmediated _bn _2rdamedia |
||
| 338 |
_avolume _bnc _2rdacarrier |
||
| 596 | _a3 | ||
| 650 | 0 |
_aSemiconductors. _93882 |
|
| 650 | 0 |
_aSemiconductors _xTesting. _93882 |
|
| 907 |
_a.b10141376 _b07-11-22 _c15-03-18 |
||
| 998 |
_am _b06-11-22 _cm _da _e- _feng _g _h0 |
||
| 999 |
_c8302 _d8302 |
||