000 01185cam a2200325 i 4500
001 u66350
003 SIRSI
005 20240619145128.0
008 110131 eng
020 _a9812563954
020 _a9789812563958
050 _aTK7871.85
_b.L47 2005
100 1 _aLevinshtein, M. E.. ,
_eauthor
_9174012
245 1 0 _aBreakdown phenomena in semiconductors and semiconductor devices /
_cMichael Levinshtein, Juha Kostamovaara and Sergey Vainshtein.
264 1 _aLondon :
_bWorld Scientific,
_c2005.
300 _axiii, 1128 pages :
_billustrations ;
_c25 cm.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
490 1 _aSelected topics in electronics and systems ;
_vv. 36
596 _a1 3
650 0 _aSemiconductors.
_93882
650 0 _aBreakdown (Electricity).
_93659
650 0 _aHigh voltages.
_93658
700 1 _aKostamovaara, Juha.
_9174013
700 1 _aVainshtein, Sergey.
_9174014
907 _a.b10143671
_b07-11-22
_c15-03-18
998 _am
_b06-11-22
_cm
_da
_e-
_feng
_g
_h0
999 _c8440
_d8440