000 01201cam a2200325 i 4500
001 u68536
003 SIRSI
005 20240619145130.0
008 110131 eng
020 _a0387257373
020 _a9780387257372
020 _a9780387281339
050 _aTK7871.99.M44
_b.L42 2006
245 0 0 _aLeakage in nanometer CMOS technologies /
_cedited by Siva G. Narendra, Anantha Chandrakasan.
264 1 _aNew York :
_bSpringer,
_c2006.
300 _ax, 307 pages :
_billustrations ;
_c24 cm.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
490 1 _aSeries on integrated circuits and systems
596 _a1 3
650 0 _aMetal oxide semiconductors, Complementary
_xDesign and construction.
_974
650 0 _aIntegrated circuits
_xDesign and construction.
_9170
650 0 _aElectric leakage
_xPrevention.
_9176567
700 1 _aNarendra, Siva G.
_9176568
700 1 _aChandrakasan, Anantha P.
_9115477
907 _a.b10145485
_b07-11-22
_c15-03-18
998 _am
_b06-11-22
_cm
_da
_e-
_feng
_g
_h0
999 _c8539
_d8539