| 000 | 01362cam a2200337 i 4500 | ||
|---|---|---|---|
| 001 | u89360 | ||
| 003 | SIRSI | ||
| 005 | 20240619145154.0 | ||
| 008 | 110131 eng | ||
| 020 | _a9780387465463 | ||
| 020 | _a0387465464 | ||
| 050 |
_aTK7871.99.M44 _b.D43 2007 |
||
| 245 | 0 | 0 |
_aDefect-oriented testing for nano-metric CMOS VLSI circuits / _cedited by Manoj Sachdev, Jose Pineda de Gyvez. |
| 250 | _a2nd ed. | ||
| 264 | 1 |
_aBoston, MA : _bSpringer, _c2007. |
|
| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_aunmediated _bn _2rdamedia |
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| 338 |
_avolume _bnc _2rdacarrier |
||
| 490 | 1 |
_aFrontiers in electronic testing ; _v34 |
|
| 500 | _aNew edition of: Defect oriented testing for CMOS analog and digital circuits, 1998. | ||
| 596 | _a1 3 | ||
| 650 | 0 |
_aMetal oxide semiconductors, Complementary _xTesting. _9202071 |
|
| 650 | 0 |
_aMetal oxide semiconductors, Complementary _xDefects. _926453 |
|
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xTesting. _9125471 |
|
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xDefects. _9202072 |
|
| 700 | 1 |
_aSachdev, Manoj. _922631 |
|
| 700 | 1 |
_aPineda de Gyvez, Jose. _9117430 |
|
| 907 |
_a.b10164674 _b07-11-22 _c15-03-18 |
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| 998 |
_am _b06-11-22 _cm _da _e- _feng _g _h0 |
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| 999 |
_c9573 _d9573 |
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