000 01370cam a2200313 i 4500
001 u97383
003 SIRSI
005 20240619145202.0
008 110131 eng
020 _a9783908451433
_qpbk.
020 _a3908451434
_qpbk.
050 _aTK7871.85
_b.G47 2008
245 0 0 _aGettering and defect engineering in semiconductor technology XII :
_bGADEST 2007 : Proceedings of the 12th International Autumn Meeting EMFCSC, Erice, Italy : October 14-19, 2007 /
_cedited by, A. Cavallini ... [and others].
264 1 _aZurich :
_bTrans Tech,
_c2008.
300 _axv, 642 pages :
_billustrations ;
_c25 cm.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
596 _a1 3
650 0 _aSemiconductors
_vCongresses.
_93882
650 0 _aGetters
_vCongresses.
_912068
650 0 _aSilicon crystals
_xDefects
_vCongresses.
_9211715
650 0 _aElectrical engineering
_xMaterials
_vCongresses.
_93003
700 1 _aCavallini, A.
_9211716
711 2 _aInternational Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology"
_n(12th :
_d2007 :
_cErice, Italy) )
_9211717
907 _a.b10171460
_b07-11-22
_c15-03-18
998 _am
_b06-11-22
_cm
_da
_e-
_feng
_g
_h0
999 _c9949
_d9949