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In situ real-time characterization of thin films /

In situ real-time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss. - xi, 263 pages : illustrations ; 24 cm.

A Wiley-Interscience Publication

ISBN: 0471241415

Subjects--Topical Terms:
Thin films.

LC Class. No.: QC176.83 / .I57 2001

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