In situ real-time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss.

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TextPublisher: New York : John Wiley, 2001Description: xi, 263 pages : illustrations ; 24 cmContent type:

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Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	QC176.83 .I57 2001 (Browse shelf(Opens below))	Available		1000050596

A Wiley-Interscience Publication

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