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Semiconductor device and failure analysis : using photon emission microscopy /

Wai, Kin Chim. ,

Semiconductor device and failure analysis : using photon emission microscopy / Wai Kin Chim. - xv, 269 pages : illustrations ; 24 cm.

ISBN: 047149240X

Subjects--Topical Terms:
Semiconductors --Failures.
Semiconductors --Testing.
Semiconductors --Microscopy.
Photon emission.

LC Class. No.: TK7871.852 / .W34 2000

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