Semiconductor device and failure analysis : (Record no. 7219)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01022cam a2200289 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | u42174 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | SIRSI |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20240619145059.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 110131 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 047149240X |
| 050 ## - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | TK7871.852 |
| Item number | .W34 2000 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Wai, Kin Chim. , |
| Relator term | author |
| 9 (RLIN) | 144271 |
| 245 10 - TITLE STATEMENT | |
| Title | Semiconductor device and failure analysis : |
| Remainder of title | using photon emission microscopy / |
| Statement of responsibility, etc. | Wai Kin Chim. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
| Place of production, publication, distribution, manufacture | Chichester : |
| Name of producer, publisher, distributor, manufacturer | John Wiley, |
| Date of production, publication, distribution, manufacture, or copyright notice | 2000. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xv, 269 pages : |
| Other physical details | illustrations ; |
| Dimensions | 24 cm. |
| 336 ## - CONTENT TYPE | |
| Content type term | text |
| Content type code | txt |
| Source | rdacontent |
| 337 ## - MEDIA TYPE | |
| Media type term | unmediated |
| Media type code | n |
| Source | rdamedia |
| 338 ## - CARRIER TYPE | |
| Carrier type term | volume |
| Carrier type code | nc |
| Source | rdacarrier |
| 596 ## - | |
| -- | 1 3 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Semiconductors |
| General subdivision | Failures. |
| 9 (RLIN) | 3882 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Semiconductors |
| General subdivision | Testing. |
| 9 (RLIN) | 3882 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Semiconductors |
| General subdivision | Microscopy. |
| 9 (RLIN) | 3882 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Photon emission. |
| 9 (RLIN) | 39741 |
| 907 ## - LOCAL DATA ELEMENT G, LDG (RLIN) | |
| a | .b10122795 |
| b | 07-11-22 |
| c | 15-03-18 |
| 998 ## - LOCAL CONTROL INFORMATION (RLIN) | |
| -- | m |
| Operator's initials, OID (RLIN) | 06-11-22 |
| Cataloger's initials, CIN (RLIN) | m |
| First date, FD (RLIN) | a |
| -- | - |
| -- | eng |
| -- | |
| -- | 0 |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Total checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH | Main Library General | 18/06/2024 | TK7871.852 .W34 2000 | 1000083896 | 18/06/2024 | 18/06/2024 | Books - Printed |