MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01362cam a2200337 i 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
u89360 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
SIRSI |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20240619145154.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
110131 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9780387465463 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0387465464 |
| 050 ## - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| Classification number |
TK7871.99.M44 |
| Item number |
.D43 2007 |
| 245 00 - TITLE STATEMENT |
|---|
| Title |
Defect-oriented testing for nano-metric CMOS VLSI circuits / |
| Statement of responsibility, etc. |
edited by Manoj Sachdev, Jose Pineda de Gyvez. |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
2nd ed. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
|---|
| Place of production, publication, distribution, manufacture |
Boston, MA : |
| Name of producer, publisher, distributor, manufacturer |
Springer, |
| Date of production, publication, distribution, manufacture, or copyright notice |
2007. |
| 336 ## - CONTENT TYPE |
|---|
| Content type term |
text |
| Content type code |
txt |
| Source |
rdacontent |
| 337 ## - MEDIA TYPE |
|---|
| Media type term |
unmediated |
| Media type code |
n |
| Source |
rdamedia |
| 338 ## - CARRIER TYPE |
|---|
| Carrier type term |
volume |
| Carrier type code |
nc |
| Source |
rdacarrier |
| 490 1# - SERIES STATEMENT |
|---|
| Series statement |
Frontiers in electronic testing ; |
| Volume/sequential designation |
34 |
| 500 ## - GENERAL NOTE |
|---|
| General note |
New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998. |
| 596 ## - |
|---|
| -- |
1 3 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Metal oxide semiconductors, Complementary |
| General subdivision |
Testing. |
| 9 (RLIN) |
202071 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Metal oxide semiconductors, Complementary |
| General subdivision |
Defects. |
| 9 (RLIN) |
26453 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Integrated circuits |
| General subdivision |
Very large scale integration |
| -- |
Testing. |
| 9 (RLIN) |
125471 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Integrated circuits |
| General subdivision |
Very large scale integration |
| -- |
Defects. |
| 9 (RLIN) |
202072 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Sachdev, Manoj. |
| 9 (RLIN) |
22631 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Pineda de Gyvez, Jose. |
| 9 (RLIN) |
117430 |
| 907 ## - LOCAL DATA ELEMENT G, LDG (RLIN) |
|---|
| a |
.b10164674 |
| b |
07-11-22 |
| c |
15-03-18 |
| 998 ## - LOCAL CONTROL INFORMATION (RLIN) |
|---|
| -- |
m |
| Operator's initials, OID (RLIN) |
06-11-22 |
| Cataloger's initials, CIN (RLIN) |
m |
| First date, FD (RLIN) |
a |
| -- |
- |
| -- |
eng |
| -- |
|
| -- |
0 |