Defect-oriented testing for nano-metric CMOS VLSI circuits / edited by Manoj Sachdev, Jose Pineda de Gyvez.

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TextSeries: Publisher: Boston, MA : Springer, 2007Edition: 2nd edContent type:

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Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK7871.99.M44 .D43 2007 (Browse shelf(Opens below))	Available		1000217344

New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998.

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