Image from Amazon.com
Thin film analysis by x-ray scattering / Mario Birkholz.
Material type:
TextPublisher: Hoboken, NJ : John Wiley, 2006Description: xxii, 356 pages : illustrations ; 25 cmContent type: - text
- unmediated
- volume
- 3527310525
- QC176.83 .B57 2006
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QC176.83 .B57 2006 (Browse shelf(Opens below)) | Available | 1000174200 | ||
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | QC176.83 .B57 2006 (Browse shelf(Opens below)) | Available | 1000174199 |
Browsing PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH shelves, Shelving location: Main Library General Close shelf browser (Hides shelf browser)
|
|
|
|
|
|
|
||
| QC176.82 .N36 2004 Nanostructured thin films and nanodispersion strengthened coatings / | QC176.83 .A43 2006 Fundamentals of nanoscale film analysis / | QC176.83 .B57 2006 Thin film analysis by x-ray scattering / | QC176.83 .B57 2006 Thin film analysis by x-ray scattering / | QC176.83 .I57 2001 In situ real-time characterization of thin films / | QC176.83 .S73 2006 Principles of physical vapor deposition of thin films / | QC176.83 .S73 2006 Principles of physical vapor deposition of thin films / |
3
There are no comments on this title.
Log in to your account to post a comment.