Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman.

By:

Contributor(s):

Material type: Text

TextPublisher: New York : Society of Manufacturing Engineers, 2005Description: x, 206 pages : illustrations ; 24 cmContent type:

Media type:

Carrier type:

ISBN:

Subject(s):

LOC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	HD47.3 .S27 2005 (Browse shelf(Opens below))	Available		1000201198

Previous								Next
Previous	HD47.3 .K38 1998 Value management : creating competititve advantage /	HD47.3 .K38 1998 Value management : creating competititve advantage /	HD47.3 .K38 1998 Value management : creating competititve advantage /	HD47.3 .S27 2005 Value analysis tear-down : a new process for product development and innovation /	HD47.3 .S73 2003 Essentials of cost management /	HD47.3 M547S 2016 Stop spending, start managing : strategies to transform wasteful habits /	HD47.4 .A66 2008 Applied benefit-cost analysis /	Next

1 3

There are no comments on this title.

to post a comment.