VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

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TextSeries: Publisher: Boston : Elsevier, 2006Description: xxx, 777 pages : illustrations ; 24 cmContent type:

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Item type	Current library	Call number	Status	Date due	Barcode
Books - Printed	PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General	TK7874.75 .V58 2006 (Browse shelf(Opens below))	Available		1000199955

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