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VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
Material type:
TextSeries: Publisher: Boston : Elsevier, 2006Description: xxx, 777 pages : illustrations ; 24 cmContent type: - text
- unmediated
- volume
- 9780123705976
- 0123705975
- TK7874.75 .V58 2006
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Books - Printed | PERPUSTAKAAN GUNASAMA HAB PENDIDIKAN TINGGI PAGOH Main Library General | TK7874.75 .V58 2006 (Browse shelf(Opens below)) | Available | 1000199955 |
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| TK7874.75 .T84 1996 Mixed analog -digital VLSI devices and technology : an introduction / | TK7874.75 .V57 2000 The VLSI handbook / | TK7874.75 .V574 2003 VLSI technology / | TK7874.75 .V58 2006 VLSI test principles and architectures : design for testability / | TK7874.75 .V59 2010 VLSI design for video coding : H.264/AVC encoding from standard specification to chip / | TK7874.75 .V59 2010 VLSI design for video coding : H.264/AVC encoding from standard specification to chip / | TK7874.76 .U47 2000 ULSI devices / |
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